发明名称 IN-CIRCUIT TESTING METHOD
摘要 PURPOSE:To adapt various printed boards by using a prober driving table which has automatic probers whose variable locations are selectively arranged against contact points on wiring as fittable free at the upper side of a printed board. CONSTITUTION:A prober driving table 11 provided with automatic probers 121- 123 whose contact points within prescribed ranges are varies in directions X and Y selectively is set freely over a printed board 1. The connector terminals of the printed board 1 are connected to a connector 15 and lead wires from the connector 15 are connected to a scanner to perform automatic scanning among those lead wires on the basis of a program in a CPU10. Then, impedance is measured among an optional number of points selected among lead wires 131-133 from the automatic probers 121-123 and the lead wires from the connector 15. The automatic probers 121-123 are positioned by a prober control part 14 according to the kinds of various printed boards 1.
申请公布号 JPS5797467(A) 申请公布日期 1982.06.17
申请号 JP19800174095 申请日期 1980.12.10
申请人 FUJITSU KK 发明人 KURIBAYASHI NOBUHIKO
分类号 G01R31/28 主分类号 G01R31/28
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