| 摘要 |
<p>An arrangement for determining the length Lx of arbitrary shift registers, which registers may be in the form of test objects, not exceeding a predetermined maximum length Lmax, wherein the arrangement is connected to an input of the test object for generating a test shift pattern of length Lmax + K, with K?2 which consists of a defined bit configuration. that is only binary ones, with a defined data transition at its end facing the test object and which is shifted through the test object, a storage of the length Lmax + K which is connected to an output of the test object and which, a the shift pattern is shifted, accommodates the information of the length Lx of the test object and the part Lmax + K - Lx of the test shift pattern and a display field, whose individual fields are permanently associated with one storage cell, each of the storages indicating the content of the cell, so that the data transition, and thus the end and the length Lx, of the test object can be determined.</p> |
