| 摘要 |
<p>Apparatus and test film strip (F) for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas (B, M1, M2, D) on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area (B), the acceptable or tool light threshold of a maximum density or dark area (D) and the acceptable/too light and acceptable/too dark threshold of a medium density test area (M1, M2). Sequence testing of the graded density areas is functionally related on a single film strip to timing marks (T1-T8), adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.</p> |
