发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the disconnection of a wiring metal, by removing over half of etching material, followed by removing the rest while applying ultrasonic vibration, at a photoetching process with the use of wet etching liquid. CONSTITUTION:A material to be etched 2 formed on a semiconductor substrate 1 is removed over half of it with etching liquid from an opening of a photo- resist film 4. And then, the rest is etched while applying ultrasonic vibration. This vibration 5 is reacted to a resist portion which does not stick to the material to be etched. It decreases its sticky condition and smooths the edges of the material to be etched. An IC with no disconnection illustrated in the figure can be obtained, even if a wiring metal 3 is formed on the material to be etched 2 after completion of etching, accordingly.
申请公布号 JPS5789228(A) 申请公布日期 1982.06.03
申请号 JP19800165506 申请日期 1980.11.25
申请人 SUWA SEIKOSHA KK 发明人 HIRAKAWA KAZUYOSHI
分类号 H01L21/306;(IPC1-7):01L21/306 主分类号 H01L21/306
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