| 摘要 |
PURPOSE:To prevent a mulfunction in the inspection stage by quickening the operating speed so as to make a device to be tested operate at its operation clock and switching-over in a moment from one cycle pattern to another cycle pattern, by using a rapid RAM. CONSTITUTION:A control section 1 is constituted of a CPU1a which executes a program by using a micro-processor, an ROM section 1b which writes an executive program, and an RAM section 1c used for making operation, and inspection data from the control section 1 are added to a rapid RAM section 2a of a pattern generator. A clock corresponding to the operation of a device to be inspected 4 is supplied to the RAM section 2 a from a distributing section 2b, and an adress from the leading address to the ending address of a rapid RAM9 is periodically read out and input into a distributor 12. Moreover, processed data from the device 4 are written in a rapid RAM18 of a rapid RAM3a through a selecting section 3b. Then operating speed is quickened, and the operation at the operation clock of the device 4 is made possible, then, switching-over from one cycle pattern to another cycle pattern is executed in a moment. |
