发明名称 METHOD AND APPARATUS FOR ANALYSIS OF FLUORESCENCE X-RAYS
摘要 PURPOSE:To decrease measuring error of content of a prescribed element in sample, by correcting measured value by a fluorescence X-ray by the pressure of an air layer basing on a correction formula. CONSTITUTION:A sample accommodating receptacle 13 is placed on a window 12 formed in a sample stand 1 and the primary X-rays from an X-ray tube 21 is irradiated to a sample 16 in the receptacle 13 through an air layer 17 and a cell sheet 15. Fluorescence X-rays radiated from the sample 16 are detected as a voltage pulse by a detector 32 through an X-ray filter 31 and the value of a pulse waveheight in accordance with the concentration is counted by a counter 34 through a waveheight discriminator 33. Output from the counter 34 is expressed in terms of content of a prescribed element basing on calibration curve by an operation mechanism 41 and also, this conversion value is corrected by the output from an atmospheric pressure correction mechanism 50 and a temperature correction mechanism 60 basing on a correction formula using the atmospheric pressure and temperature as the variables and is outputted to a printing mechanism 44. Hereby, analysis of fluorescence X-ray is carried out accurately.
申请公布号 JPS5786030(A) 申请公布日期 1982.05.28
申请号 JP19800161584 申请日期 1980.11.17
申请人 IDEMITSU KOSAN KK 发明人 TAKAGISHI TOSHIAKI
分类号 G01N23/223;(IPC1-7):01N23/223 主分类号 G01N23/223
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