发明名称 Method of manufacturing a semiconductor element.
摘要 <p>This invention relates to a method of manufacturing a plurality of semiconductor elements from a semiconductor wafer in which a plurality of active elements are formed and is intended to provide particularly a semiconductor element-manufacturing method which saves the semiconductor wafer from cracks or damage during the manufacture of a semiconductor element and enables a solder layer to be deposited on the element regions without irregularities in thickness. The method starts with the step of forming a first metal layer (12) acting as an ohmic electrode by wet plating on each side of the element regions of a semiconductor wafer (11) in which a plurality of active elements are formed or on the whole surface of each side of the wafer (11).Then a second metal layer (14) which has an anticorrosive property and acts as a brazing material when the semiconductor element is mounted between a pair of electrodes, is formed on each of the element areas in the first metal layers (12). …<??>Finally, those portions of the semiconductor wafer which are interposed between the active elements are chemically etched off with the second metal layers (14) used as masks to separate the semiconductor elements (15) from each other, thereby producing a plurality of semiconductor elements (15), each of which has its surfaces coated with the first and second metal layers.</p>
申请公布号 EP0052309(A1) 申请公布日期 1982.05.26
申请号 EP19810109514 申请日期 1981.11.04
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 NAKAMURA, KISAKU;JIMI, EIJI;GOTO, HARUYUKI;HORI, AKIO
分类号 H01L21/52;H01L21/28;H01L21/288;H01L21/60;H01L21/78;H01L23/492;(IPC1-7):01L21/78;01L21/288 主分类号 H01L21/52
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