发明名称 SURFACE FLAW DETECTOR
摘要 PURPOSE:To reduce the calculation time of flaw area by determining a frequency distribution in scanning of a laser beam over the surface of a test object with respect to the count of the normal surface obtained from each scanning based on detection signals of the reflected beam. CONSTITUTION:A laser beam scans over the surface of a test object and reflected beam signals 9 are converted into normal surface discrimination signal 14 via a nomal surface discrinimation circuit 19. This signal is imputted into an AND gate 18 with a inspection area signal 16 and a clock pulse 17 and applied to a counting circuit 20 as normal surfac pulse 19. A normal surface counted value 21 is inputted into a CPU23 with a counting end signal 22 to determine a frequency distribution through a memory device 25. Based on the result, a flaw area D is calculated by computing D=ASIGMA(K=1,h)K [NL-K], where NL is proper length of the test object, K natural number, and h natural number of maximum value NL. This can reduce the calculation time of the flaw area.
申请公布号 JPS5777907(A) 申请公布日期 1982.05.15
申请号 JP19800154202 申请日期 1980.10.31
申请人 MITSUBISHI DENKI KK 发明人 SHIROSHITA KENJI;NISHIKAWA SATORU
分类号 G01N21/88;G01B11/28;G01B11/30;G01B21/30;G01N21/952 主分类号 G01N21/88
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