发明名称 |
CONTAIMINATION PREVENTING DEVICE IN ELECTRON RAY DEVICE |
摘要 |
PURPOSE:To prevent the contamination of an electron ray stop and a knife-edge for measuring the diameter of electron beams without any influence over electron beams, by heating the electron ray stop and the knife-edge. CONSTITUTION:A conductive heat insulator 5 for intercepting heat is interposed between an electron ray stop lens 3 and an electron ray stop 4. A semiconductive laser 6 is set on the inner wall of the end drum 9, and a portion of the electron ray stop 4 which is apt to be contaminated due to collision with electron beams is irradiated concentrically by laser beams 7 and heated. On the other hand, a conductive heat insulator 12 for intercepting heat is interposed between a Faraday cup 10 and a knife-edge 11, and a portion of the knife-edge 11 colliding with electron beams 1 is irradiated concentrically by laser beams from a semiconductor laser 13 and heated. |
申请公布号 |
JPS5774956(A) |
申请公布日期 |
1982.05.11 |
申请号 |
JP19800151062 |
申请日期 |
1980.10.28 |
申请人 |
NIPPON DENSHIN DENWA KOSHA |
发明人 |
MATSUDA KOREHITO;MURASHITA TATSU;TAKAMOTO KIICHI;SHIMAZU NOBUO |
分类号 |
H01J37/20;H01J37/02;H01J37/09;H01J37/305;H01L21/027 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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