发明名称 CONTAIMINATION PREVENTING DEVICE IN ELECTRON RAY DEVICE
摘要 PURPOSE:To prevent the contamination of an electron ray stop and a knife-edge for measuring the diameter of electron beams without any influence over electron beams, by heating the electron ray stop and the knife-edge. CONSTITUTION:A conductive heat insulator 5 for intercepting heat is interposed between an electron ray stop lens 3 and an electron ray stop 4. A semiconductive laser 6 is set on the inner wall of the end drum 9, and a portion of the electron ray stop 4 which is apt to be contaminated due to collision with electron beams is irradiated concentrically by laser beams 7 and heated. On the other hand, a conductive heat insulator 12 for intercepting heat is interposed between a Faraday cup 10 and a knife-edge 11, and a portion of the knife-edge 11 colliding with electron beams 1 is irradiated concentrically by laser beams from a semiconductor laser 13 and heated.
申请公布号 JPS5774956(A) 申请公布日期 1982.05.11
申请号 JP19800151062 申请日期 1980.10.28
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 MATSUDA KOREHITO;MURASHITA TATSU;TAKAMOTO KIICHI;SHIMAZU NOBUO
分类号 H01J37/20;H01J37/02;H01J37/09;H01J37/305;H01L21/027 主分类号 H01J37/20
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