发明名称 Metallizing semiconductor devices
摘要 Silicon semiconductor devices, e.g. integrated circuits are metallized with a silicon/aluminum alloy by exposure to silane and an aluminum alkyl vapour at an elevated temperature and reduced pressure. The process eliminates the prior hydrogen plasma treatment and subsequent annealing of conventional vacuum deposition of aluminum and provides good step and crack coverage.
申请公布号 US4328261(A) 申请公布日期 1982.05.04
申请号 US19800199799 申请日期 1980.10.23
申请人 ITT INDUSTRIES, INC. 发明人 HEINECKE, RUDOLF A. H.;STERN, RONALD C.
分类号 C23C16/20;C23C16/42;H01L21/285;H01L21/3205;(IPC1-7):H01L21/28 主分类号 C23C16/20
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