| 摘要 |
<p>PURPOSE:To shorten a test time, by simultaneously selecting plural optional blocks divided into plural blocks, and writing to the respective blocks. CONSTITUTION:A memory array 11 is divided into blocks 111-114. Outputs of the blocks 111-114 are connected to writing circuits 71-74, and are connected in common to an outputting circuit 9 through transmission gates 81-84. The writing circuits 71-74 are controlled by outputs WS1-WS4 of a selecting/non-selecting circuit 31, and an output DIN of an inputting circuit 32. A multiwrite switching circuit 33 sends signals MW1 (MW2) and their reverse signals to an address buffer 23 and 24, respectively, by which a multiwrite state is obtained.</p> |
