| 摘要 |
PURPOSE:To facilitate the anaylsis of dependence on a test pattern by storing information of test results only confined to the desired portion of the test pattern to enable the separation of defects without alteration of the test pattern. CONSTITUTION:A start register 9 and a stop register 10 are provided corresponding flags 9' and 10' are arranged to allow the selection of four kinds of storage mode. At the mode 0, information is stored in a range of the whole process as designated with the start register 9 and the stop register 10. At the mode 1, the storage of information covers the part from a certain position to the end of the sequence, that from the first to the intermediate position at the mode 2 and the entire process at the mode 3. The use of the modes enables the storage of information for a specified part of each test pattern sequence as desired thereby facilitating the analysis of the test results for LSI devices 4. |
