发明名称 SCANNING TYPE ELECTRON MICROSCOPE
摘要 PURPOSE:To accurately adjust a focal point by supplying the current which corresponds to the excitation current value of an auxiliary lens located near the magnetic field of an objective lens to an electron beam deflection means and moving the electron beam in an arbitray direction. CONSTITUTION:A voltage signal which is proportional to excitation current is supplied to an auxiliary lens 2 located near the magnetic field of an objective lens 1 and supplied to varible resistors 11 and 12 through a gain-1 inverted amplifier 10. The output is applied to horizontal and vertical amplifiers 6 and 7. Thus an electron beam can be moved in an arbitrary direction only for the quantity that is proportional to the excitation intensity of the auxiliary lens 2. As a result, the electron beam can completely be prevented from being moved on a sample by exciting the auxiliary lens 2 and a focal point accurately be adjusted.
申请公布号 JPS5767275(A) 申请公布日期 1982.04.23
申请号 JP19800143008 申请日期 1980.10.15
申请人 HITACHI SEISAKUSHO KK 发明人 YAMADA OSAMU
分类号 H01J37/21;H01J37/28 主分类号 H01J37/21
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