| 发明名称 |
Corona charging for testing reliability of insulator-covered semiconductor devices |
| 摘要 |
A method for predicting certain electrical failures in a semiconductor device after long-term operation, includes the steps of measuring a predetermined parameter of the semiconductor device before and after it is exposed to a corona discharge and then comparing the two measurements.
|
| 申请公布号 |
US4326165(A) |
申请公布日期 |
1982.04.20 |
| 申请号 |
US19800110980 |
申请日期 |
1980.01.10 |
| 申请人 |
WESTINGHOUSE ELECTRIC CORP. |
发明人 |
SZEDON, JOHN R. |
| 分类号 |
G01R31/26;G01R31/265;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
