| 摘要 |
PURPOSE:To position a probe to a correct position in accordance with the thermal elongation or contraction length of a printed substrate by measuring the positons of pattern marks for recognition of the end edge part of the printed substrate through pattern recognition, and making use of the measured results thereof. CONSTITUTION:Cruciform patterns 9 which are pattern marks for recognition are printed at four sides in the end edge parts of a printed substrate 3 which is an object. The coordinate value of the center of the pattern 9 is determined and this is stored in a memory. In accordance with the calculated value determined from the above, the substrate 3 is divided to arbitrary correction data blocks. The central coordinates of the respective blocks are determined. On the other hand, the central coordinates of the blocks before thermal elongation or contraction are beforehand determined from the designed values, and the correction value in the block is determined by subtracting the above-mentioned designed central coordinates value from the central coordinate value of the block after thermal elongation or contraction. Next, probe positioning NC data are fetched, and the discrimination is performed for each block, and the correction value for the block is added or subtracted. By the corrected data, an X-Y table 1 is moved, whereby a probe 2 is positioned. |
