发明名称 SHORT CIRCUIT TESTING DEVICE
摘要 PURPOSE:To cause short circuiting in the arbitrary phase adjusted at any point of the half wave voltage of an AC electric power source to be short-circuited and to facilitate the adjustment by applying DC bias to the voltage waveform of said power source. CONSTITUTION:A thyristor 11 for short circuiting is connected so as to cause inter-line short circuiting on the output side of an AC electric power source S to be short-circuited, and a rectifier circuit 4 is s connected as to rectify the output of the power source S and to supply the DC voltage smoothed by a capacitor C to a DC bias adjusting circuit 1 via a resistance R1. The output of the circuit 1 biasing the AC voltage of the power source S with the DC voltage supplied from the resistor R1 is supplied to a square wave generating circuit 2, by which a square wave is generated. When a manual signal and the delay pulse adjusted within the range of this square wave with the start point of said square wave as a reference point are generated simultaneously, a thyristor 11 for short circuiting the power source S is fired. Thereby, the short circuiting is caused in the adjusted arbitrary phase at any point of the half wave voltage of the power source S.
申请公布号 JPS5764174(A) 申请公布日期 1982.04.19
申请号 JP19800139403 申请日期 1980.10.07
申请人 NIPPON DENSHIN DENWA KOSHA;NIHON DENKI SEIKI KK 发明人 SHIOMI EIJIROU;YAMAI KOUJI;OOHATA HIROYUKI;MATSUZAKI TERUO
分类号 G01R31/00;G01R31/02 主分类号 G01R31/00
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