发明名称 AUTOMATIC MEASURING DEVICE OF CIRCUIT
摘要 PURPOSE:To deal with the occurrence of abnormality in the assigned district by installing a master control device to control the subcontrol devices corresponding to each district which is formed by dividing a circuit to be measured into plural districts. CONSTITUTION:Data collection and treatment of each kind of pilot signals are performed by the control of a subcontrol device 2 by using a pilot signal measuring device 3. The results are transmitted to the subcontrol unit 2. The subcontrol device 2 analyses a pilot signal and collected data in accordance with the control signal of a main control device 1 and transmits them to the main control device 1. The main control device 1 detects automatically the point where trouble is generated in accordance with the analyzed signal transmitted from each subcontrol device 2. In case abnormality related to >=2 subcontrol device 2 is detected, the main device 2 and measures the desired pilot signal in order from the center.
申请公布号 JPS5761351(A) 申请公布日期 1982.04.13
申请号 JP19800136121 申请日期 1980.09.30
申请人 ANRITSU DENKI KK 发明人 ONO MICHIHIRO;ITOU YUUJI
分类号 H04B17/00;H04B3/46 主分类号 H04B17/00
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