发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form multilayer wiring excellently by a method wherein a material having excellent characteristics at a high temperature and flatness is employed, a via-hole is shaped through development and minute working is enabled, and said material is utilized as an interlayer insulating film. CONSTITUTION:The first layer wiring 2 is shaped onto a silicon substrate 1, the surface thereof is coated with silicon dioxide, and a resin layer 6 in organosiloxane resin, etc. is applied. The resin has excellent characteristics at a high temperature, flatness and insulating property, and is utilized as a negative resist. When electron beams are irradiated to the resin layer through a mask, a section not irradiated is removed, and the via-hole 5 is shaped. When heating the surface at 450 deg.C, said resin is cured, Al is evaporated on the cured insulaying layer 6, and the second layer wiring 7 contacting with the wiring 2 is formed in the via-hole while using a photo-resist patterned as a mask.
申请公布号 JPS5759358(A) 申请公布日期 1982.04.09
申请号 JP19800134543 申请日期 1980.09.27
申请人 FUJITSU KK 发明人 TOKUNAGA HIROSHI;ABE RIYOUJI;TODA KAZUO;TAKEDA SHIROU
分类号 H01L21/768;H01L23/522;(IPC1-7):01L21/88 主分类号 H01L21/768
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