发明名称 SCINTILLATION CAMERA AND ITS ADJUSTING METHOD
摘要 PURPOSE:To permit simple and accurate adjustment of the uniformity at the determination of nonlinear parameters and automate the adjustment by removing the signal components below set levels from the detection signals of photoelectric multipliers. CONSTITUTION:The radiations from the radioactive isotopes in a specimen are detected by plural photoelectric multipliers 3 via a scintillator 1 and a light guide 2, and the detected signals are supplied via a parameter identifying jig 8 to a multichannel analyzer 10 consisting of a resistance matrix system position calculation circuit. The position calculated data are fed to a CPU11. In the CPU11, the incident position of radiations to the scintillator 1 is determined, and the distribution information of radioactive isotopes is obtained. In this case, an impedance conversion circuit EF1 is provided between a threshold circuit TH for removing the signal components below set levels and a circuit NL for the purpose of non-linear correction within the waveform shaping circuit of the jig 9, whereby the responses of the respective parameters are averaged.
申请公布号 JPS5759183(A) 申请公布日期 1982.04.09
申请号 JP19800134084 申请日期 1980.09.26
申请人 TOKYO SHIBAURA DENKI KK 发明人 YAMAKAWA TSUTOMU;NISHIKAWA MINESHIRO;KIHARA TOMOHIKO
分类号 A61B6/03;G01T1/164 主分类号 A61B6/03
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