发明名称 HANDOTAISOSHINOSEIZOHOHO
摘要 PURPOSE:To make it possible to realize in-line processing by placing wafers whose surfaces are cleaned in a heated, hermetically sealed container whose temperature is adjusted, processing them by vapor of surface improving agent, and improving the adhesion of a resist layer in a short time. CONSTITUTION:For example the surface improving agent 10 whose main component is hexamethyldisilazane is put in the hermetically sealed container 11 wherein a heater 15 and a horizontally running conveyer 12 are provided. The internal temperature is kept at e.g. 50 deg.C by a designated temperature adjuster 17. Under this state, a hermetically sealing shutter 14 provided at one side wall of the container is opened, and the wafer 3 on which resist is not applied is inserted from an inlet 13. The vapor treatment by the improving agent 10 is performed for a specified time. When the wafer 3 reaches the other side wall, the other shutter 14 is opened, and the wafer 3 is taken out of the container 11, and the resist applying process is followed. In this method, the time required for obtaining desired adhesion is shortened (to about 1/2) than in the case of room temperature treatment, and the preliminary process for improvement can be performed in the continuous process.
申请公布号 JPS5753933(A) 申请公布日期 1982.03.31
申请号 JP19800128527 申请日期 1980.09.18
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 ABE TOSHIHIRO;MATSUSHITA MASATOSHI;KYOTO KENSHO;ROKUSHA TERUMI
分类号 H01L21/027;G03F7/11;(IPC1-7):01L21/30 主分类号 H01L21/027
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