| 摘要 |
PURPOSE:To make presentation in parts unit and how defective parts are defective possible by the use of a microprocessor by obtaining the defective and non-defective chart of the test patterns corresponding to the parts troubles of electronic parts mounted on printed circuit boards. CONSTITUTION:Electronic parts, for example, ICs 1-5 constituting logical sequence are mounted on a printed circuit board 1, and input terminals A-F, and output terminals X-Z are provided. A test pattern is inputted to the terminals A-F, and the results obtained at the terminals X-Z are collected in an information collecting device. More specifically, the output information patterns of the information collecting device for the input signals are beforehand investigated, and defective electronic parts or defective modes are searched from the information patterns of the information collecting device for the printed circuit board 1 to be tested with respect to the input signals. Since the defective and non-defective chart of the test patterns corresponding to parts troubles is obtained by a method of actually simulating troubles in this way, the test patterns are less required, and the smaller memory capacity of the microprocessor is required. |
