发明名称 Mask for ion beam shadow projection - is made from mono-crystalline semiconductor slice with heavy metal deposited on it
摘要 The starting point for mfg. the mask is a mono-crystalline semi-conductor sheet, brought to the correct thickness by an etching process. A heavy metal layer, e.g. gold or chromium, is deposited on the crystal surface, and is structured by a removal technique to correspond to the pattern to be projected. Alternatively, the scatter layer pattern is produced by bombarding defined areas of the crystal layer with particles. The required thickness of the scatter pattern layers lies in the region of 0.1 micro m. Finally, the semi-conducting sheet is removed, apart from a supporting frame, by means of an anisotropic selective etch.
申请公布号 DE3035200(A1) 申请公布日期 1982.03.25
申请号 DE19803035200 申请日期 1980.09.18
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 CSEPREGI,LASZLO,DIPL.-ING.
分类号 G03F1/00;H01J37/30 主分类号 G03F1/00
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