发明名称 INSPECTING DEVICE FOR DEFECT OF CIRCUIT PATTERN ON PRINTED CIRCUIT BOARD
摘要 PURPOSE:To enable to perform marking safely at low cost without adversely affecting the surroundings, by installing a marking device supported rotatably on the inspection head of an inspecting device. CONSTITUTION:A marking device body is lowered by means of an air cylinder 11 such that a printed circuit board plate 5 contacts with a rotating roller 1. Next, a stage 15 is scanned against a detector body 12 equipped with a light source 20, a lens 19, a half mirror 18, an imaging lens 17 and a pickup device 16, and a video signal obtained from said pickup device 16 is compared with a reference conductor pattern to inspect defects. When a defect exists, its position is stored, further when the rotating roller 1 comes to the position, a marking driving device 7 is actuated by an electromagnetic solenoid 8 to push out the marking head 2 to the outside, thereby allowing marking to a defect part to be performed by a marking rubber 3. Thereby, with a simple mechanism, marking to a printed circuit board having a large number of holes such as through-holes is enabled.
申请公布号 JPS5749844(A) 申请公布日期 1982.03.24
申请号 JP19800124530 申请日期 1980.09.10
申请人 HITACHI SEISAKUSHO KK 发明人 UTO YUKIO;HARA YASUHIKO
分类号 H01L21/66;G01N21/93;G01N21/956;H01L21/027;H01L21/30 主分类号 H01L21/66
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