发明名称 MULTI-FACTOR SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To obtain a device of high reliability by a method wherein an insulating film built on a region except an electrode connecting region is constructed using a laminated structure which consists of an oxide film of a semiconductor and an insulating film which is attached from outside. CONSTITUTION:An insulating film 5 built on a regin except an electrode 6, 7 is built using a laminated structure which consists of an oxide film 11 of a semiconductor and an insulating film 12 which is attached from outside. For example after a buffer layer 2, an active layer 3 and a top layer 4 is built on a PbTe substrae 1 mesa etching is applied. Next after an anodized oxide film 11 is formed an insulating film 12 consisting of MgF2 is attached. Using a photo resist film as a mask the anodized oxide film 11 on a region on which an electrode film is to be attached and the insulating film 12 are etched. Electrode films 6, 7 are formed at the end of the process. By this arrangement a device of high reliability is obtained.
申请公布号 JPS5748287(A) 申请公布日期 1982.03.19
申请号 JP19800123649 申请日期 1980.09.05
申请人 FUJITSU KK 发明人 SHINOHARA KOUJI;NISHIJIMA YOSHINDO;FUKUDA HIROKAZU
分类号 H01S5/00;H01S5/30;(IPC1-7):01S3/18 主分类号 H01S5/00
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