| 摘要 |
PURPOSE:To obtain an IC device which can perform the evaluation test of the characteristics of a function circuit by providing only one of pin exclusive for the test. CONSTITUTION:A level signal to be applied to a pin TM is fed through an inverter 14 and an inverter 15 to a function circuit 13. Signals are respectively inputted to the pins I1-In of a decoder 11, and when the output of the inverter 14 is high level, the signals of the pins I1-In are decoded, and one of the test modes of 2<n> types is selected. A test circuit 12 outputs a signal responsive to the test mode. The function circuit 13 communicates signals through the pins I1-In and input/output pins T1- Tn when the output of the inverter 15 is high level to perform the original function, and performs the evaluation test of the characteristics of the respective function blocks in response to the output signal of the testing circuit when the output is low level. According to this configuration, the test modes of 2<n> types can be set with the input pins I1-In, and the pin exclusive for the test may only the pin TM. |
