发明名称 Messvorrichtung zur Schichtdickenmessung mit Radionukliden
摘要 An instrument for measuring the thickness of layers by means of radiation emitted from radio-active nucleides which interact with material of the layer and are then absolved by a radiation detector. A sighting mechanism determines the area of the layer to be irradiated and a diaphragm is interposed between the radio-active nucleide and the layer to define this area. A radiation detector on a supporting device can be moved into and out of a measuring position relative to this area. The sighting mechanism
申请公布号 DE2039646(A1) 申请公布日期 1972.02.17
申请号 DE19702039646 申请日期 1970.08.10
申请人 FISCHER,HELMUT 发明人 FISCHER,HELMUT
分类号 G01B15/02 主分类号 G01B15/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利