发明名称 EXPOSING METHOD AND DEVICE FOR ELECTRON BEAM RESIST
摘要 PURPOSE:To increase the sensitivity and the efficiency of pattening by the irradiation of an electron beam for the subject device by a method wherein supersonic waves are applied on the electron beam resist when performing an electron beam irradiation and with the help of this energy, the G value of the electron beam resist is improved. CONSTITUTION:The substrate 2 whereon an electron beam resist 3 was applied is placed on a stage 1 and when a patterning is performed using the electron beam 4, a supersonic wave generating element 6 is attached to the stage 1. The energy to be applied to the supersonic wave generating element is feeded by a power source 8. The supersonic waves are sent to the electron beam resist 3 through the intermediaries of the stage 1 and the substrate 2. Through these procedures, lattice osillation energy is increased and the sensitivity of the resist can also be improved.
申请公布号 JPS5740924(A) 申请公布日期 1982.03.06
申请号 JP19800116610 申请日期 1980.08.22
申请人 MITSUBISHI DENKI KK 发明人 HARADA HIROJI;OOHAYASHI YOSHIKAZU;SHIBATA ISAO;NISHIOKA KIYUUSAKU;MASUKO YOUJI
分类号 H01L21/027;H01J37/317;(IPC1-7):01L21/30 主分类号 H01L21/027
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