| 摘要 |
PURPOSE:To achieve a quicker measurement and a higher accuracy by arranging a thickness setting device for setting specified three reference thicknesses within the measuring range and a reference plate or the like with a thickness thus set in the correction of a absorption characteristic curve. CONSTITUTION:Based on signals sent from an amplifier 5, data stored in a memory circuit 7 and signals sent from a thickness setting device 8, a processing unit 6 performs a necessary computation to obtain a absorption characteristic curve. Data corresponding to the absorption characteristic curve are stored in the memory circuit 7 while a deviation of thickness is outputted to a thickness indicator 9. A measuring device is equipped with a reference plate and a reference plate driver 3. Said processing circuit 6 sends a signal to control the driver 3 in the preparation and the correction of the absorption characteristic. With such an arrangement, the correction of the absorption characteristic can be done at a high approximation accuracy employing three correcting points thereby enabling a quicker measurement and higher accuracy. To approximate the absorption characteristic curve, the equation as shown on the right is used. (where, T represents thickness, V radiation detection output and a1-a3 constants.) |
