发明名称 |
PROCESS FOR THE FABRICATION OF MASKS FOR LITHOGRAPHIC PROCESSES USING A PHOTORESIST |
摘要 |
A resist mask comprising two layers of resist, one of which is saturated with a dilutant which does not dissolve the other. In one embodiment, the two layers of resist are applied upon a substrate, the first layer of which is more soluble in a developer. The second layer is said saturated resist and the first layer is non-saturated. This composite is preferaly used to form a relief mask with recessed sidewalls used in lift-off processes. |
申请公布号 |
DE2861539(D1) |
申请公布日期 |
1982.02.25 |
申请号 |
DE19782861539 |
申请日期 |
1978.12.20 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FENG, BAI-CWO;FENG, GEORGE CHENG-CWO |
分类号 |
G03F7/26;G03C1/74;G03F1/68;G03F7/09;G03F7/095;G03F7/16;H01L21/027;H05K3/06;H05K3/14 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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