发明名称 PROCESS FOR THE FABRICATION OF MASKS FOR LITHOGRAPHIC PROCESSES USING A PHOTORESIST
摘要 A resist mask comprising two layers of resist, one of which is saturated with a dilutant which does not dissolve the other. In one embodiment, the two layers of resist are applied upon a substrate, the first layer of which is more soluble in a developer. The second layer is said saturated resist and the first layer is non-saturated. This composite is preferaly used to form a relief mask with recessed sidewalls used in lift-off processes.
申请公布号 DE2861539(D1) 申请公布日期 1982.02.25
申请号 DE19782861539 申请日期 1978.12.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FENG, BAI-CWO;FENG, GEORGE CHENG-CWO
分类号 G03F7/26;G03C1/74;G03F1/68;G03F7/09;G03F7/095;G03F7/16;H01L21/027;H05K3/06;H05K3/14 主分类号 G03F7/26
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