发明名称 METHOD OF MANUFACTURING A CONDUCTOR STRUCTURE AND APPLICATION IN A FIELD EFFECT TRANSISTOR
摘要 A method and structure for polysilicon lines which include a silicide layer for providing a low sheet resistance. The invention may be employed in a polysilicon gate MOSFET process for integrated circuits as well as other integrated structures. In the method a first layer of polysilicon is deposited followed by a deposition of a metal of the silicide forming type. Another polysilicon layer is then deposited on top of the silicide forming metal to produce a three layer structure. The three layer structure is subjected to heat, for example, during the reoxidation step in a gate fabrication process, the metal reacts with the polysilicon at two reaction fronts to form a silicide. The resultant silicide has a much lower resistivity than doped polysilicon and therefore provides a second conductive layer which can be used more compatibly and efficiently in connection with the normal metal layer employed in integrated circuits to give a two-dimensional degree of freedom for the distribution of signals.
申请公布号 DE2861516(D1) 申请公布日期 1982.02.25
申请号 DE19782861516 申请日期 1978.10.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GAENSSLEN, FRITZ HEINRICH
分类号 H01L29/78;H01L21/28;H01L21/321;H01L21/336;H01L21/768;H01L23/532;H01L29/423;H01L29/43;H01L29/49;(IPC1-7):01L21/88;01L23/52;01L21/60;01L29/76 主分类号 H01L29/78
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