发明名称 SUBSTRATE TESTING MACHINE
摘要 PURPOSE:To simplify a pressure device and to make a testing machine small-sized, by preparing only the number of contacts which are required for executing one parts test, and executing their locate control independently. CONSTITUTION:This testing machine is provided with a co-ordinate locating device 4 for locating each co-ordinate of contacts 1-3, a substrate fixing device 6 for fixing a printing substrate 5 to be tested, and a pressure device 7 for making each contact press-contact onto the substrate 5. In both ends of parts 8 to be measured are placed a source contact 1 and an input contact 2, and in a prescribed check point around the parts 8 is placed a guard contact 3. By a driving control of a pulse motor in the device 4, the contact 3 is located at an optional check point 5A, and the contacts 1, 2 are located to check points 5B, 5C relating to the parts 8. When each location has been completed, each contact is made to contact with the check points 5A-5C by prescribed pressure, and the parts 8 are tested.
申请公布号 JPS5729965(A) 申请公布日期 1982.02.18
申请号 JP19800104678 申请日期 1980.07.30
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 KASHIWAGI TAKASHI
分类号 G01R31/28;G01R1/073 主分类号 G01R31/28
代理机构 代理人
主权项
地址