发明名称 RESIN SEALED SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To obtain a semiconductor element with excellent resistance to heat and high-temperature electrical characteristics by using resin materials, as sealing agent, composed of one or more hardener of selected from Novolak-type epoxi resin, Novolak-type phenol resin and acid anhydride and an appropriate hardening catalyst. CONSTITUTION:A semicondutor device is sealed by means of a resin materials composed of three elements, which an Novolak-type epoxi resin of epoxi equivalent of 170-300, more than one kind of hardeners selected from Novolak-type phenol resin and acid anhydride and a hardening catalyst composed of bataine type adduct produced by addition reaction of a compound with pi bond with third organic phosphine, the semiconductor device is sealed. It is recommended to use phthal anhydride as acid anhydride, and carbon bisulfide, carbon biselenate and malein anhydride as hardening catalyst. If necessary, inorganic filling-up material such as quartz glass powder may be added.</p>
申请公布号 JPS5724553(A) 申请公布日期 1982.02.09
申请号 JP19800098681 申请日期 1980.07.21
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 IKETANI HIROTOSHI;HATANAKA AYAKO;SUZUKI SHIYUICHI;WADA MORIKIYOU
分类号 C08G59/00;C08G59/68;C08L63/00;H01L23/29;H01L23/31 主分类号 C08G59/00
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