MEASUREMENT OF SEMICONDUCTOR DEVICE

摘要

PURPOSE:To imorove the testing efficiency of a semiconductor such as IC by connecting a lead pin of a semiconductor device on an insulator to a contact pin of a fixed substrate movable vertically. CONSTITUTION:Lead pins 12 of a semiconductor device 11 which are placed on recesses 21 of an insulated belt 17 or the like are connected to contact pins 19 of a low resistance with the elasticity of a vertically movable fixed substate 18 and the device 11 is tested with a measuring device 15 through the contact pins 19. The connection state between the pins 12 and the pins 19 can be inspected visually through a through hole provided in the substrate 18. This improves the testing efficiency of the semicondutor with a construction of facilitating automation of the measurement.