发明名称 Circuit arrangement for monitoring the function of read-only and/or random-access memories
摘要 For monitoring the function of read-only and/or random-access memories (5) connected to an operating program unit (2), a test program unit (7) running synchronously with the operating program unit (2) is provided, the said test program unit being connected for the purpose of preparing test parameters to a test parameter memory (8), which can be addressed by it and the data outputs of which are connected to the one inputs of a test data comparator (9), the second data inputs of which are connected to the data lines (4) leading from the operating program unit (2) to the memory (5) to be monitored. For calling up the memory contents to be tested, the test program unit (7) is connected to the address line (3) leading from the operating program unit (2) to the memory (5). During the course of the operating program, the test program unit periodically supplies a test program, the operating program unit (2) being inhibited by the test program unit (7) during the testing process. The operating program unit (2) is only enabled again by the test program unit (7) when there is coincidence between the data to be compared by the test data comparator (9). <IMAGE>
申请公布号 DE3115524(A1) 申请公布日期 1982.02.04
申请号 DE19813115524 申请日期 1981.04.16
申请人 SCHRACK ELEKTRONIK-AG 发明人 HUMMEL,JAN
分类号 G11C29/16;(IPC1-7):G11C29/00;G05B23/02;G07C3/08 主分类号 G11C29/16
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