发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the electric characteristics by forming compound semiconductor protective film of different etching properties on a compound semiconductor layer formed on a compound semiconductor substrate, forming an ion injected region through the protective film and heat treating it to remove rhe protective film. CONSTITUTION:A high resistance GaGs layer 2 is grown by 1mum on a semiinsulating substrate 1, and Ga0.5Al0.5As layer protective film 3 is continuously grown by 0.2mum thereon. Si ions are injected through the later 3 to the layer 2 to form an injection region 5. Then, it is heat treated to activate the ion injected layer 5 to form an active layer 5'. The layer 3 is etched and removed to form a source 6, drain 8 and gate 7 electrodes. Thus, the compound semiconductor having excellent electric properties can be obtained.
申请公布号 JPS5721824(A) 申请公布日期 1982.02.04
申请号 JP19800096075 申请日期 1980.07.14
申请人 FUJITSU LTD 发明人 NISHI HIDETOSHI;HIYAMIZU SUKEHISA
分类号 H01L29/80;H01L21/203;H01L21/265;H01L21/314;H01L21/338;H01L29/812;H01L33/30;H01S5/00 主分类号 H01L29/80
代理机构 代理人
主权项
地址