发明名称 DATA CORRECTION SYSTEM IN MEASURING CIRCUIT
摘要 <p>PURPOSE:To decrease the error of measurement by correcting variation of characteristics incorporated in the using parts in the measuring circuit by using the software program. CONSTITUTION:Variation of oscillation frequency which is incorporated in a crystal oscillator 1 is previously measured and data including the using condition of temperature are stored in a memory (ROM)4. When the output of the crystal oscillator 1 is counted to measure the time, the output can be obtained at a display measuring section 3 when a CPU6 reads count number of a frequency division circuit 2 and correcting is performed by proceeding the operational procedures stored in a memory 5 on the basis of the data stored in the memory 4.</p>
申请公布号 JPS5717811(A) 申请公布日期 1982.01.29
申请号 JP19800094657 申请日期 1980.07.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAJIMA TSUNEYA
分类号 G01D3/02;G01R15/00 主分类号 G01D3/02
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