发明名称 DRY ETCHING APPARATUS
摘要 PURPOSE:To provide an etching apparatus realizing a highly accurate and stable etching eliminating troubles such as deterioration of a resist by preventing a continuous rise in the temperature of a sample on a lower electrode with intermittent application of a high frequency power. CONSTITUTION:An etching gas is introduced at a gas feed port 7 exhausting through an exhaust port 6 to maintain a chamber 1 at a low pressure inside. A high frequency power is applied on a lower electrode 3 from a high frequency power source 5' to generate a plasma discharge by a high frequency between it and an upper electrode 2 grounded whereby a sample 4 placed on the lower electrode 3 is etched. The high frequency power source 5' with a chopper circuit applies a high frequency power intermittently. This prevents constinuous rise in the temperature of the sample on the lower electrode thereby eliminating troubles such as deterioration of a resist. Thus, a highly accurate and stable etching can be realized.
申请公布号 JPS5732637(A) 申请公布日期 1982.02.22
申请号 JP19800108697 申请日期 1980.08.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 KINOSHITA SHIGEJI;WATAKABE YAICHIROU
分类号 H01L21/302;H01J37/32;(IPC1-7):01L21/302 主分类号 H01L21/302
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