发明名称 CHARACTERISTIC MEASURING INSTRUMENT OF SEMICONDUCTOR
摘要 PURPOSE:To prevent damage of amplifier by setting attenuators on the front stage of the amplifier to adjust the level of signals inputted by variation of impedance on the output side. CONSTITUTION:An amplifier 12 is connected on the output side of the high-frequency oscillator 10 through a circulator 13 and a continuously variable type attenuator 19, and a measuring transistor 18 and an output voltmeter 17 are connected to the output side of the amplifier 12 through a directional coupling 14. If input side of the TR18 is short-circuited, load impedance against the amplifier 12 becomes small and amplifier may be broken because the maximum output power exceeds the tolerance. In this case, attenuation is controlled by the attenuator 19 by using the negative feedback loop NF1 so that the maximum output power does not exceed the tolerance. Therefore, by this constitution, damage of amplifier can be prevented.
申请公布号 JPS5714758(A) 申请公布日期 1982.01.26
申请号 JP19800089810 申请日期 1980.07.01
申请人 NIPPON ELECTRIC CO 发明人 SHIMODA JIYUNICHI
分类号 G01R31/26 主分类号 G01R31/26
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