发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To attain high integration of a semiconductor device by a method wherein a metal film is formed adhering on the surface of a diffusion layer formed in a silicon substrate, and a gate and a wiring between the gate and the metal film are formed with Mo films. CONSTITUTION:The diffusion layer 6 is formed in the silicon substrate 1 making a photo resist to cover the part to be corresponded to a gate oxide film 4 as a mask. Then the metal film 9 is formed on the region including on the diffusion layer 6 and excluding on the gate oxide film 4 by the lift off technique, and the Mo films 3 are formed selectively on the gate oxide film 4 and the metal film 9. The Mo films 3 are used both as the gate and the wiring to connect the gate to the metal film 9.
申请公布号 JPS577971(A) 申请公布日期 1982.01.16
申请号 JP19800083082 申请日期 1980.06.18
申请人 SANYO ELECTRIC CO 发明人 KONISHI SHINICHI;NOGUCHI KAZUYUKI
分类号 H01L21/28;H01L21/3205;H01L23/52;H01L29/43;H01L29/78 主分类号 H01L21/28
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