发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To attain high integration of a semiconductor device by a method wherein a metal film is formed adhering on the surface of a diffusion layer formed in a silicon substrate, and a gate and a wiring between the gate and the metal film are formed with Mo films. CONSTITUTION:The diffusion layer 6 is formed in the silicon substrate 1 making a photo resist to cover the part to be corresponded to a gate oxide film 4 as a mask. Then the metal film 9 is formed on the region including on the diffusion layer 6 and excluding on the gate oxide film 4 by the lift off technique, and the Mo films 3 are formed selectively on the gate oxide film 4 and the metal film 9. The Mo films 3 are used both as the gate and the wiring to connect the gate to the metal film 9. |
申请公布号 |
JPS577971(A) |
申请公布日期 |
1982.01.16 |
申请号 |
JP19800083082 |
申请日期 |
1980.06.18 |
申请人 |
SANYO ELECTRIC CO |
发明人 |
KONISHI SHINICHI;NOGUCHI KAZUYUKI |
分类号 |
H01L21/28;H01L21/3205;H01L23/52;H01L29/43;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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