发明名称 METODO PARA FORMAR UN CALIBRADOR DE LA DEFORMACION.
摘要 <p>A strain gauge comprised of a premagnetized ferromagnetic film wherein any change in length of the film is converted into a planar Hall voltage by employing the property of magnetostriction and the planar Hall effect. Alternately, a change in the length of the film can also be measured as a change in electric conductivity by employing the properties of magnetostriction and magnetoresistance. The strain gauge is deposited on a substrate by thin-film techniques and has a very high sensitivity.</p>
申请公布号 ES551152(D0) 申请公布日期 1988.05.01
申请号 ES19520005511 申请日期 1986.01.23
申请人 ALCATEL STANDARD ELECTRICA, S.A. 发明人
分类号 G01B7/00;G01B7/16;G01B7/24;G01L1/12;G01L1/22;(IPC1-7):G01B7/24;G01L9/16 主分类号 G01B7/00
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