发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a preferable single crystalline semiconductor thin film on an insulating film by emitting a laser or the like to amorphous Si formed in the groove of the film having a groove, controlling the quality of the crystal, then forming amorphous Si on the overall surface, emitting again the laser or the like. CONSTITUTION:A thermally oxidized film 12 is formed on a single crystalline Si substrate 11, a groove (having, for example, a rectangular shape of 2mumX30mum and a depth of approx. 0.1mum with a pitch of 4mum) is formed on the film 12, a polycrystalline Si 15 is formed in the groove, the crystal is controlled in quality by emitting a laser light, electron beam or the like thereto, and a polycrystalline Si 16 is formed on the overall surface, the laser light or electron beam is again emitted thereto, the crystal is thus controlled as a whole with the Si controlled in quality in the groove as nuclide, and is entirely single-crystallized. Thus preferable single crystalline semiconductor film can be readily formed on the insulating film, and a high speed semiconductor device can be manufactured in high density.
申请公布号 JPS575327(A) 申请公布日期 1982.01.12
申请号 JP19800080587 申请日期 1980.06.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HIRAO TAKASHI;WATANABE MASANORI;NAGATA SEIICHI
分类号 H01L29/78;H01L21/02;H01L21/20;H01L21/336;H01L21/86;H01L27/12;H01L29/786 主分类号 H01L29/78
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