发明名称 PATTERN FOR CHECKING REGISTRATION ACCURACY
摘要 PURPOSE:To facilitate judgement of whether the deviations between respective layers are within standard or not without being affected by dimensional deviations by using specific patterns. CONSTITUTION:Reference lines 3 positioned at the transverse center of the pattern 1 for checking the registration accuracy of a 1st layer are formed by each piece vertically and horizontally to said pattern. Reference lines 4 positioned at he transverse center of the pattern 2 for checking the registration accuracy of the 2nd layer are formed by each two pieces vertically and horizontally to said patterns. The deviation between the two layers is judged to be within the standard if the lines 3 exist in the region sandwiched by the lines 4. The deviation is judged to be off the standard if the lines 3 is off the region sandwiched by the lines 4. The positions of the reference lines do not change even if the widths of the respective layers change according to these patterns and, therefore, only the positional deviation can be checked without being affected by the dimensional deviation.
申请公布号 JPS63266453(A) 申请公布日期 1988.11.02
申请号 JP19870101181 申请日期 1987.04.24
申请人 SEIKO EPSON CORP 发明人 NODA YOICHI
分类号 G03F1/00;G03F1/38 主分类号 G03F1/00
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