发明名称 METHOD FOR TESTING OF LIGHT RESISTANCE
摘要 PURPOSE:To provide a colleration to the results of both accelerated deterioration test and exposure test by carrying out durability test in the same wavelength region under the same light energy level at the time of carrying out both tests. CONSTITUTION:A specimen 2 to be subjected to exposure test is disposed within a broad case 1 of a shallow bottom, and the top surface thereof is covered with a cut- off filter 3 of a flat plate shape. This is installed outdoors where it is exposed to sunlight. The specimen 2 to be subjected to accelerated deterioration test is disposed on the outside circumference of a cylindrical cut-off filter 3 which is covering the circumference of a light source 4 of xenon lamp or sunshine carbon arc. By using the same cut filter 3 in this way, both tests are carried out at the same level, and the results of both tests exhibit a constant correlation.
申请公布号 JPS57544(A) 申请公布日期 1982.01.05
申请号 JP19800073326 申请日期 1980.05.31
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 TSUKAMOTO AKIRA
分类号 G01N17/00;(IPC1-7):01N17/00 主分类号 G01N17/00
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