发明名称 SEMICONDUCTOR STRUCTURE WITH IMPROVED PHOSPHOSILICATE GLASS ISOLATION
摘要 <p>In a field effect device such as a charge coupled device or field effect transistor in which at least two levels of polycrystalline silicon conductors are used; these two levels of polycrystalline silicon are isolated from one another with a dielectric layer. Disclosed is a dielectric layer of reflowed phosphosilicate glass (PSG) on top surface of a polycrystalline silicon layer which may be doped by phosphorous impurities diffusing from PSG.</p>
申请公布号 CA1115856(A) 申请公布日期 1982.01.05
申请号 CA19790322415 申请日期 1979.02.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GARBARINO, PAUL L.;REVITZ, MARTIN;SHEPARD, JOSEPH F.
分类号 H01L29/78;H01L21/3105;H01L21/321;H01L21/339;H01L21/8234;H01L29/762;(IPC1-7):01L21/225 主分类号 H01L29/78
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