发明名称 CHECKING DEVICE FOR CIRCUIT SUBSTRATE
摘要 PURPOSE:To check a circuit substrate simply, by connecting respective corresponding check positions of the substrate to be checked and of a reference substrate and by applying an AC voltage across both check positions to detect the output level of the connection point. CONSTITUTION:A substrate to be checked and a reference substrate having a standard network are prepared, and swtiches S1-S4 are provided which select respective corresponding to check positions TP0-TPn-1 and TP0'-TPn-1'. For example, when the check positions TP1-TP3 of the substrate to be checked and the check positions TP1'-TP3' of the reference substrate are selected, AC voltage V1 is applied from an oscillator 1 across the check positions TP1-TP3', and AC voltage V0 is taken out from the connection point of both check positions. These voltages are converted to DC voltages by AC-DC converters 2 and 5 and are compared with each other; and if V1=2V0 is true, it is discriminated that there are nothing abnormal about there check points. This operation is repeated successively to check the circuit substrate including a capacitor, etc. simply.
申请公布号 JPS56162065(A) 申请公布日期 1981.12.12
申请号 JP19800066177 申请日期 1980.05.19
申请人 PIONEER ELECTRONIC CORP 发明人 OOAMI TAKESHI
分类号 H05K13/08;G01R31/28;G01R31/316 主分类号 H05K13/08
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