发明名称 VERFAHREN ZUM PASSIVIEREN VON SILICIUMBAUELEMENTEN
摘要 <p>Passivation of aluminum-metallized silicon components by applying at least one silicon layer. For the purpose of the subsequent contacting, the components are annealed after the application of the silicon layer at a temperature from 480 DEG to 570 DEG C. if the silicon layer thickness exceeds 0.1 mu m and a temperature from 400 DEG to 500 DEG C. if the silicon layer is up to about 0.1 mu m thick, it being possible to omit the annealing operation if the silicon layer thickness is less than about 0.05 mu m.</p>
申请公布号 DE3021175(A1) 申请公布日期 1981.12.10
申请号 DE19803021175 申请日期 1980.06.04
申请人 SIEMENS AG 发明人 DATHE,JOACHIM,DIPL.-PHYS.
分类号 H01L23/52;H01L21/314;H01L21/3205;H01L21/321;H01L21/56;H01L21/60;(IPC1-7):01L21/324;01L21/56 主分类号 H01L23/52
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