发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor having SOT(semiconductor on insulator) structure in which the wafer can be prevented from warping while sustaining a high breakdown strength and a fabrication method thereof. SOLUTION: An SOI layer 9 is formed on the surface of a silicon substrate 1 through buried oxide 7 and n-ch IGBTs (insulated gate bipolar transistor) and CMOS transistors are fabricated thereon. The silicon substrate 1 is deposited with rear oxide 3 and holes 3a for exposing a part of the rear surface of the silicon substrate 1 are made therein. Finally, rear surface electrodes 5 are formed to touch the exposed rear surface of the silicon substrate 1 while covering the oxide 3.</p> |
申请公布号 |
JPH10144894(A) |
申请公布日期 |
1998.05.29 |
申请号 |
JP19960300237 |
申请日期 |
1996.11.12 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
AKIYAMA HAJIME;TAKENO YOSHIMIZU |
分类号 |
H01L21/316;H01L23/52;H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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