发明名称 DOUBLE FOCUSING MASS SPECTROMETER
摘要 PURPOSE:To enhance the sensitivity of a mass spectrometer by restricting both the angle of each part and the ratio of the dimension of each part of the spectrometer within a given range. CONSTITUTION:Concentric double toroidal electrodes A and B deflect an ionic beam at an approximately right angle. An ionic beam discharged from these electrodes A and B is further deflected by a deflection magnetic field at an approximately right angle. The angle of each part, and the ratio of the dimension of each part of a mass spectrometer are restricted within the following ranges. 0.9<=re/rm<=1.2, 0.8<=RE1/re<=2.0, 0.5<=RE2/re1.2, 32 deg.<=Ep1<=36 deg., -10 deg.<= Ep2<=-8 deg., 0.9rm<=le' <=1.2rm, 0.4re/Re 0.6. Ionic beams to and from the deflection magnetic field are both oblique to the field.
申请公布号 JPS56156663(A) 申请公布日期 1981.12.03
申请号 JP19800058920 申请日期 1980.05.01
申请人 SHIMADZU CORP 发明人 TAKEDA TAKEHIRO
分类号 H01J49/20;H01J49/32 主分类号 H01J49/20
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