| 摘要 |
PURPOSE:To generate a test pattern suitable for respective blocks by providing a control register on a linear feedback shift register (LFSR) which is one of the combined test circuit of an LSI and obtaining the degree of freedom. CONSTITUTION:A flip flop of a D type (DF/F)1 is initialized and next, control data from a data input line is serial-transferred to respective control registers 14 by a clock 21. Since the register 14 is constituted of the DF/F1, every time the clock 21 is inputted to a CLK, the data of a terminal D is presented in a terminal Q, among the (n) pieces of registers, the data moves from left to right and functions as a shift register. Namely, input data are serially inputted from input lines 15 and 16. Thus, a value is set to the respective DF/F1s of the (n) pieces of registers 14, the values of the respective DF/F1s are changed according to the input data and the bit length of an LFSR and the position of an output terminal can be freely changed. |
