发明名称 DISPOSITIF DE MEMORISATION A SEMI-CONDUCTEURS
摘要 The semiconductor memory contains a degenerate semiconductor layer (1) and a nondegenerate semiconductor layer (2) having traps in the energy gap. The conductivity type of the degenerate semiconductor layer (1) is opposite to that of the nondegenerate semiconductor layer (2). Situated between the degenerate semiconductor layer (1) and the nondegenerate semiconductor layer (2) is a dielectric layer (4) capable of tunnel conduction. Deposited on the nondegenerate semiconductor layer (2) is a layer of material (5) which forms a potential barrier with the nondegenerate semiconductor layer (2) and, together with the dielectric layer (4) which is capable of tunnel conduction, prevents the penetration of the charge carriers from the degenerate semiconductor layer (1) and from the ohmic contact (6) into the nondegenerate semiconductor layer (2). <IMAGE>
申请公布号 FR2482785(A1) 申请公布日期 1981.11.20
申请号 FR19810009768 申请日期 1981.05.15
申请人 INSTITUT RADIOTEKHNIKI ELEKTRONI 发明人 MORDUKH ILICH ELINSON, MARAT RAIMDZHANOVICH MADYAROV, BORIS ALEXEEVICH MALAKHOV, VADIM IVANOVICH POKALYAKIN, SERGEI ANATOLIEVICH TERESHIN, GENRIKH VLADIMIROVICH STEPANOV ET VITALY GEORGIEVICH TESTOV;MADYAROV MARAT RAIMDZHANOVICH;MALAKHOV BORIS ALEXEEVICH;POKALYAKIN VADIM IVANOVICH;TERESHIN SERGEI ANATOLIEVICH;STEPANOV GENRIKH VLADIMIROVICH;TESTOV VITALY GEORGIEVICH
分类号 H01L27/112;G11C16/02;G11C17/00;H01L21/8246;H01L21/8247;H01L29/15;H01L29/74;H01L29/788;H01L29/792;H01L29/861;H01L45/00;(IPC1-7):H01L29/66;G11C11/34 主分类号 H01L27/112
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